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Publication | Open Access

Conduction Mechanism and Improved Endurance in HfO2-Based RRAM with Nitridation Treatment

DOIFull Paper Access

74

Citations

18

References

2017

Year

Fang-Yuan Yuan, Ning Deng, Chih‐Cheng Shih, Yi‐Ting Tseng, Ting‐Chang Chang, Kuan‐Chang Chang, Minghui Wang, Wen‐Chung Chen, Huaqiang Wu, He Qian,
Nanoscale Research Letters

References

YearCitations

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