Resistive Random-access Memory

Resistive Random-Access Memory is a non-volatile solid-state memory device that stores data by modulating the resistance of a dielectric material through the application of voltage, distinguishing itself from other memory technologies by employing resistive switching mechanisms at the nanoscale.

2.7K

Publications

149.7K

Citations

8.9K

Authors

1.3K

Institutions

Publications per year

2017–2026

1.3K

Variants

ReramRram

Authors

8.9K

  1. SY
    Shimeng Yu

    Georgia Institute of Technology, United States

    85 publications · 8.9K citations

    41

    h-index

  2. BG
    Bin Gao

    Tsinghua University, China

    76 publications · 6K citations

    40

    h-index

  3. QL
    Qi Liu

    Chinese Academy of Sciences, China

    66 publications · 4.3K citations

    37

    h-index

  4. ML
    Ming Liu

    Chinese Academy of Sciences, China

    59 publications · 4K citations

    37

    h-index

  5. DI
    Daniele Ielmini

    Politecnico di Milano, Italy

    58 publications · 4.1K citations

    36

    h-index

1–5 of 8.9K

Venues

  1. Applied Physics Letters

    202 publications · 9.9K citations

    56

    h-index

  2. IEEE Electron Device Letters

    215 publications · 10.2K citations

    55

    h-index

  3. IEEE Transactions on Electron Devices

    183 publications · 11.3K citations

    55

    h-index

  4. Advanced Materials

    40 publications · 6.7K citations

    36

    h-index

  5. Scientific Reports

    51 publications · 4.1K citations

    34

    h-index

1–5