Fu-Yen Jian

Developments in nanocrystal memory

Ting-Chang Chang, Fu-Yen Jian, Shih-Cheng Chen et al. · Materials Today · 2011 · 303 citations · Full text

Materials Science, Flash Nonvolatile Memory, Electrical Engineering +15

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh et al. · Applied Physics Letters · 2011 · 161 citations

Electrical Engineering, Engineering, Nanoelectronics +11

Investigating the Drain-Bias-Induced Degradation Behavior Under Light Illumination for InGaZnO Thin-Film Transistors

Tien‐Yu Hsieh, Ting‐Chang Chang, Te-Chih Chen et al. · IEEE Electron Device Letters · 2012 · 46 citations

Engineering, Semiconductor Device, Electronic Devices +16

NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain

Chia-Sheng Lin, Ying-Chung Chen, Ting‐Chang Chang et al. · IEEE Electron Device Letters · 2011 · 42 citations

Engineering, Mechanical Engineering, Nbti Stress +17

A MICROMACHINED POLYSILICON HOT-WIRE ANEMOMETER

Fu-Yen Jian, Yuan‐Chuan Tai, Chih‐Ming Ho et al. · 1994 · 42 citations · Full text

Electrical Engineering, Engineering, Micromachines +7