Te-Chih Chen - Concepedia

Author

Te-Chih Chen

National Sun Yat-sen University

Also Known As

Te-Chih Chen

Publications

Citations

H-Index

Concepts

All Affiliations

National Sun Yat-sen University National Cheng Kung University AU Optronics (Taiwan)National Yang Ming Chiao Tung University Industrial Technology Research Institute

About

Te-Chih Chen is an author at National Sun Yat-sen University specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	16	21	963
2	Applied Physics	16	21	963
3	Electrical Engineering	16	18	867
4	Materials Science	8	8	280
5	Materials Engineering	1	1	47

Te-Chih Chen

Publications

963

Citations

H-Index

Page 1

	Year	Citations
Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress Te-Chih Chen, Ting‐Chang Chang, Chih-Tsung Tsai, Applied Physics Letters Semiconductor TechnologyElectrical EngineeringElectronic DevicesEngineeringPhysics	2010	183
Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh, Applied Physics Letters Electrical EngineeringEngineeringNanoelectronicsElectronic EngineeringStress-induced Leakage Current	2011	161
Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh, Applied Physics Letters Light-induced InstabilityElectrical EngineeringAccelerated Recovery RateIlluminated BehaviorsEngineering	2010	106
Self-Heating-Effect-Induced Degradation Behaviors in a-InGaZnO Thin-Film Transistors Tien‐Yu Hsieh, Ting‐Chang Chang, Te-Chih Chen, IEEE Electron Device Letters Materials EngineeringMaterials ScienceElectrical EngineeringSelf-heating-effect-induced Degradation BehaviorsEngineering	2012	47
Investigating the Drain-Bias-Induced Degradation Behavior Under Light Illumination for InGaZnO Thin-Film Transistors Tien‐Yu Hsieh, Ting‐Chang Chang, Te-Chih Chen, IEEE Electron Device Letters EngineeringSemiconductor DeviceElectronic DevicesIngazno Thin-film TransistorsCompound Semiconductor	2012	46
Review of Present Reliability Challenges in Amorphous In-Ga-Zn-O Thin Film Transistors Tien‐Yu Hsieh, Ting‐Chang Chang, Te-Chih Chen, ECS Journal of Solid State Science and Technology EngineeringPhysical ModelsSemiconductor DeviceLight-induced InstabilityNanoelectronics	2014	44
Self-heating enhanced charge trapping effect for InGaZnO thin film transistor Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh, Applied Physics Letters Semiconductor TechnologyElectrical EngineeringEngineeringNanoelectronicsStress-induced Leakage Current	2012	42
NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain Chia-Sheng Lin, Ying-Chung Chen, Ting‐Chang Chang, IEEE Electron Device Letters EngineeringMechanical EngineeringNbti StressSemiconductor DeviceStressstrain Analysis	2011	42
Improvement in the bias stability of amorphous InGaZnO TFTs using an Al 2 O 3 passivation layer Sheng-Yao Huang, Ting‐Chang Chang, Min-Chen Chen, Surface and Coatings Technology Materials ScienceAluminium NitrideEngineeringOxide ElectronicsApplied Physics	2012	36
High temperature-induced abnormal suppression of sub-threshold swing and on-current degradations under hot-carrier stress in a-InGaZnO thin film transistors Ming-Yen Tsai, Ting‐Chang Chang, Ann‐Kuo Chu, Applied Physics Letters Semiconductor TechnologyElectrical EngineeringHot-carrier StressEngineeringHigh Temperature	2013	34

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