Te-Chih Chen

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

Te-Chih Chen, Ting‐Chang Chang, Chih-Tsung Tsai et al. · Applied Physics Letters · 2010 · 183 citations

Semiconductor Technology, Electrical Engineering, Electronic Devices +14

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh et al. · Applied Physics Letters · 2011 · 161 citations

Electrical Engineering, Engineering, Nanoelectronics +11

Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition

Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh et al. · Applied Physics Letters · 2010 · 106 citations

Light-induced Instability, Electrical Engineering, Accelerated Recovery Rate +10

Self-Heating-Effect-Induced Degradation Behaviors in a-InGaZnO Thin-Film Transistors

Tien‐Yu Hsieh, Ting‐Chang Chang, Te-Chih Chen et al. · IEEE Electron Device Letters · 2012 · 47 citations

Materials Engineering, Materials Science, Electrical Engineering +12

Investigating the Drain-Bias-Induced Degradation Behavior Under Light Illumination for InGaZnO Thin-Film Transistors

Tien‐Yu Hsieh, Ting‐Chang Chang, Te-Chih Chen et al. · IEEE Electron Device Letters · 2012 · 46 citations

Engineering, Semiconductor Device, Electronic Devices +16