Chih-Tsung Tsai

Influence of electrode material on the resistive memory switching property of indium gallium zinc oxide thin films

Min-Chen Chen, Ting‐Chang Chang, Chih-Tsung Tsai et al. · Applied Physics Letters · 2010 · 191 citations

Engineering, Bipolar Behavior, Phase Change Memory +16

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

Te-Chih Chen, Ting‐Chang Chang, Chih-Tsung Tsai et al. · Applied Physics Letters · 2010 · 183 citations

Semiconductor Technology, Electrical Engineering, Electronic Devices +14

Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor

Chih-Tsung Tsai, Ting‐Chang Chang, Shih-Ching Chen et al. · Applied Physics Letters · 2010 · 171 citations

Materials Science, Positive Bias Stress, Electrical Engineering +12

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh et al. · Applied Physics Letters · 2011 · 161 citations

Electrical Engineering, Engineering, Nanoelectronics +11

Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition

Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh et al. · Applied Physics Letters · 2010 · 106 citations

Light-induced Instability, Electrical Engineering, Accelerated Recovery Rate +10