Tien‐Yu Hsieh

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

Te-Chih Chen, Ting‐Chang Chang, Chih-Tsung Tsai et al. · Applied Physics Letters · 2010 · 184 citations

Engineering, Electrical Engineering, Materials Science +17

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh et al. · Applied Physics Letters · 2011 · 161 citations

Engineering, Electrical Engineering, Materials Science +17

Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition

Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh et al. · Applied Physics Letters · 2010 · 106 citations

Engineering, Materials Engineering, Materials Science +17

Effect of mechanical-strain-induced defect generation on the performance of flexible amorphous In–Ga–Zn–O thin-film transistors

Po‐Yung Liao, Ting‐Chang Chang, Wan-Ching Su et al. · Applied Physics Express · 2016 · 53 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Impact of repeated uniaxial mechanical strain on p-type flexible polycrystalline thin film transistors

Bo‐Wei Chen, Ting‐Chang Chang, Yu-Ju Hung et al. · Applied Physics Letters · 2015 · 52 citations

Natural Sciences, Electrical Engineering, Materials Science +17