Investigation of the gate-bias induced instability for InGaZnO TFTs under dark and light illumination - Concepedia

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Investigation of the gate-bias induced instability for InGaZnO TFTs under dark and light illumination

43

Citations

18

References

2011

Year

T.C. Chen, Ting‐Chang Chang, Tzu-I Hsieh, Chin‐Hsien Tsai, S.C. Chen, Chang‐Shen Lin, Fu-Yen Jian, Min‐Yeh Tsai

Thin Solid Films

PhotonicsEngineeringPhysicsOptical PropertiesApplied PhysicsIngazno TftsLight IlluminationOptoelectronicsGate-bias Induced Instability

References

	Year	Citations

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