Jhe-Ciou Jhu

Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors

Geng-Wei Chang, Ting‐Chang Chang, Jhe-Ciou Jhu et al. · IEEE Transactions on Electron Devices · 2014 · 42 citations

Engineering, Electrical Engineering, Materials Science +17

Suppress temperature instability of InGaZnO thin film transistors by N2O plasma treatment, including thermal-induced hole trapping phenomenon under gate bias stress

Geng-Wei Chang, Ting‐Chang Chang, Jhe-Ciou Jhu et al. · Applied Physics Letters · 2012 · 39 citations

Engineering, Electrical Engineering, Materials Science +17

The asymmetrical degradation behavior on drain bias stress under illumination for InGaZnO thin film transistors

Sheng-Yao Huang, Ting‐Chang Chang, Li-Wei Lin et al. · Applied Physics Letters · 2012 · 19 citations

Engineering, Electrical Engineering, Materials Science +17

Reduction of defect formation in amorphous indium-gallium-zinc-oxide thin film transistors by N2O plasma treatment

Jhe-Ciou Jhu, Ting‐Chang Chang, Geng-Wei Chang et al. · Journal of Applied Physics · 2013 · 16 citations

Engineering, Electrical Engineering, Physics +17

Abnormal Subthreshold Leakage Current at High Temperature in InGaZnO Thin-Film Transistors

Geng-Wei Chang, Ting‐Chang Chang, Jhe-Ciou Jhu et al. · IEEE Electron Device Letters · 2012 · 13 citations

Engineering, Electrical Engineering, Materials Science +15