Microelectronics Reliability · 2017 · 28 citations · 37 references
EngineeringElectrical EngineeringMaterials EngineeringComputational Heat TransferElectronic MaterialsHeat TransferHeat Transfer ModelingMoisture SorptionMoisture TransportMoisture-resistant MaterialsPackaging EngineeringThermal DiffusivityDynamic LoadingMoistureMoisture Diffusion ResistanceMoisture Transfer ModelingMoisture Transport ModelingMoisture-heat Transfer CouplingPackage Modeling
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Analysis of Package Cracking During Reflow Soldering Process
Makoto Kitano, A. Nishimura, Sueo KAWAI et al. · Reliability physics · 1988 · 181 citations