RSC Advances · 2017 · 10 citations · 21 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsNanomaterialsSemiconductor DevicesCurrent DistributionDevice ReliabilityElectrical ConductivityInterconnect FormationSemiconductor Device MaterialsSemiconductor ReliabilityCurrent Stress ReliabilityElectrical Interconnect ReliabilityElectrical ReliabilityElectromigration ReliabilityInterconnect CharacterizationInterconnect FabricationInterconnect ReliabilityMorphological Evolution Rates
Ag interconnects fabricated by a printing method were tested under accelerated temperature and current stressing to investigate their electrical reliability and morphological evolution.
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Jolke Perelaer, Patrick J. Smith, Dario Mager et al. · Journal of Materials Chemistry · 2010 · 740 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +13
Direct writing of copper conductive patterns by ink-jet printing
Bong Kyun Park, Dongjo Kim, Sunho Jeong et al. · Thin Solid Films · 2007 · 548 citations
Natural Sciences, Materials Engineering, Materials Science +6
John G. Bai, Ziyang Zhang, Jesus N. Calata et al. · IEEE Transactions on Components and Packaging Technologies · 2006 · 370 citations