Current-induced morphological evolution and reliability of Ag interconnects fabricated by a printing method based on nanoparticles

Kyung-Tae Jang, Jae-Sun Hwang, Yongjin Park, Jae-Chan Lee, Narae Kim, Jiwoo Yu, Young‐Chang Joo

RSC Advances · 2017 · 10 citations · 21 references

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Abstract

Ag interconnects fabricated by a printing method were tested under accelerated temperature and current stressing to investigate their electrical reliability and morphological evolution.

References

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