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1/f noise in advanced CMOS transistors
37
Citations
22
References
2011
Year
Device ModelingLow-power ElectronicsElectrical EngineeringNano-scale DimensionsEngineeringNanoelectronicsElectronic EngineeringMixed-signal Integrated CircuitApplied PhysicsBias Temperature InstabilityComputer EngineeringNoiseAdvanced Cmos TransistorsDeep SubmicronMicroelectronicsChannel Length
This paper is a review of 1/f noise in state-of-the-art advanced MOSFETs, where the channel length has deep submicron or nano-scale dimensions. The origin of 1/f noise, models of 1/f noise, and ways of measuring 1/f noise are briefly reviewed.
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2002 | 358 | |
1985 | 310 | |
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