Concepedia

Abstract

This paper is a review of 1/f noise in state-of-the-art advanced MOSFETs, where the channel length has deep submicron or nano-scale dimensions. The origin of 1/f noise, models of 1/f noise, and ways of measuring 1/f noise are briefly reviewed.

References

YearCitations

2002

358

1985

310

2000

265

2010

252

2008

235

2000

171

2001

162

1992

144

1998

105

2006

102

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