S. Chaudhry

Statistical Modeling With the PSP MOSFET Model

Xin Li, Colin C. McAndrew, Weimin Wu et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2010 · 44 citations

Device Modeling, Oscillator Gate Delays, Electrical Engineering +12

Benchmark Tests for MOSFET Compact Models With Application to the PSP Model

Xin Li, Weimin Wu, Amit Jha et al. · IEEE Transactions on Electron Devices · 2009 · 38 citations

Engineering, Vlsi Design, Power Electronics +17

1/f noise in advanced CMOS transistors

Yael Nemirovsky, Dan Corcos, Igor Brouk et al. · IEEE Instrumentation & Measurement Magazine · 2011 · 37 citations

Device Modeling, Low-power Electronics, Electrical Engineering +13

Dopant dose loss at the Si–SiO2 interface

H.-H. Vuong, C.S. Rafferty, S. A. Eshraghi et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 36 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +10

The stress assisted evolution of point and extended defects in silicon

S. Chaudhry, Mark E. Law · Journal of Applied Physics · 1997 · 32 citations

Engineering, Silicon On Insulator, Defect Tolerance +20