G. Ghibaudo

Electrical noise and RTS fluctuations in advanced CMOS devices

G. Ghibaudo, T. Boutchacha · Microelectronics Reliability · 2002 · 358 citations

Electrical Engineering, Engineering, Circuit System +6

Strain-Induced Performance Enhancement of Trigate and Omega-Gate Nanowire FETs Scaled Down to 10-nm Width

R. Coquand, M. Cassé, Sylvain Barraud et al. · IEEE Transactions on Electron Devices · 2013 · 68 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +15

Analytical modeling of organic solar cells and photodiodes

Stéphane Altazin, R. Clerc, R. Gwoziecki et al. · Applied Physics Letters · 2011 · 44 citations

Electrical Engineering, Engineering, Photochemistry +15

Effect of Localized Interface Charge on the Threshold Voltage of Short-Channel Undoped Symmetrical Double-Gate MOSFETs

E.G. Ioannidis, A. Tsormpatzoglou, D.H. Tassis et al. · IEEE Transactions on Electron Devices · 2010 · 39 citations

Device Modeling, Electrical Engineering, Semiconductor Device +11

Impact of source-to-drain tunnelling on the scalability of arbitrary oriented alternative channel material nMOSFETs

Quentin Rafhay, R. Clerc, G. Ghibaudo et al. · Solid-State Electronics · 2008 · 30 citations

Electrical Engineering, Engineering, Rf Semiconductor +6