D. J. Day

1/<i>f</i> and random telegraph noise in silicon metal-oxide-semiconductor field-effect transistors

Michael J. Uren, D. J. Day, M. J. Kirton · Applied Physics Letters · 1985 · 310 citations

Semiconductor Technology, Room Temperature, Electrical Engineering +13

An integrating detector for serial scan thermal imaging

C.T. Elliott, D. J. Day, David J. Wilson · Infrared Physics · 1982 · 77 citations

Engineering, Thermography, Medical Imaging +10

Flat-panel imaging system for fluoroscopy applications

Richard E. Colbeth, Maxwell J. Allen, D. J. Day et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1998 · 39 citations

Engineering, Microscopy, Digital Imager +17

Impact ionization of deep traps in semi-insulating GaAs substrates

Z.-M. Li, S. P. McAlister, W. G. McMullan et al. · Journal of Applied Physics · 1990 · 37 citations

Device Modeling, Electrical Engineering, Semiconductor Device +13

Double quantum well resonant tunnel diodes

D. J. Day, Y.K. Chung, Chris Webb et al. · Applied Physics Letters · 1990 · 36 citations

Categoryquantum Electronics, Room Temperature, Double Quantum +8