A.P. van der Wel

Reducing MOSFET 1/f noise and power consumption by switched biasing

Eric A.M. Klumperink, S.L.J. Gierkink, A.P. van der Wel et al. · IEEE Journal of Solid-State Circuits · 2000 · 265 citations

Low-power Electronics, Electrical Engineering, Engineering +10

Intrinsic 1/f device noise reduction and its effect on phase noise in CMOS ring oscillators

S.L.J. Gierkink, Eric A.M. Klumperink, A.P. van der Wel et al. · IEEE Journal of Solid-State Circuits · 1999 · 104 citations · Full text

Engineering, Oscillators, High-frequency Device +11

Low-Frequency Noise Phenomena in Switched MOSFETs

A.P. van der Wel, Eric A.M. Klumperink, J.S. Kolhatkar et al. · IEEE Journal of Solid-State Circuits · 2007 · 92 citations · Full text

Engineering, Analog Design, Power Electronics +16

MOSFET 1/f noise measurement under switched bias conditions

A.P. van der Wel, Eric A.M. Klumperink, S.L.J. Gierkink et al. · IEEE Electron Device Letters · 2000 · 77 citations

Electrical Engineering, Switching Frequency, Switched Mosfet +13

Modeling random telegraph noise under switched bias conditions using cyclostationary rts noise

A.P. van der Wel, Eric A.M. Klumperink, L.K.J. Vandamme et al. · IEEE Transactions on Electron Devices · 2003 · 67 citations

Bias Conditions, Engineering, Random Telegraph Noise +8