Reducing MOSFET 1/f noise and power consumption by switched biasing

Eric A.M. Klumperink, S.L.J. Gierkink, A.P. van der Wel, +1

IEEE Journal of Solid-State Circuits

Low-power ElectronicsElectrical EngineeringEngineeringCircuit SystemMixed-signal Integrated Circuit +8

Intrinsic 1/f device noise reduction and its effect on phase noise in CMOS ring oscillators

S.L.J. Gierkink, Eric A.M. Klumperink, A.P. van der Wel, +3

IEEE Journal of Solid-State Circuits

EngineeringOscillatorsHigh-frequency DeviceBias Temperature InstabilityAnalog Design +9

Low-Frequency Noise Phenomena in Switched MOSFETs

A.P. van der Wel, Eric A.M. Klumperink, J.S. Kolhatkar, +5

IEEE Journal of Solid-State Circuits

EngineeringAnalog DesignPower ElectronicsRf Circuit DesignCircuit System +14

MOSFET 1/f noise measurement under switched bias conditions

A.P. van der Wel, Eric A.M. Klumperink, S.L.J. Gierkink, +2

IEEE Electron Device Letters

Electrical EngineeringSwitching FrequencySwitched MosfetEngineeringMeasurement +11

Modeling random telegraph noise under switched bias conditions using cyclostationary rts noise

A.P. van der Wel, Eric A.M. Klumperink, L.K.J. Vandamme, +1

IEEE Transactions on Electron Devices

Bias ConditionsEngineeringRandom Telegraph NoiseCyclostationary Rts NoiseMixed-signal Integrated Circuit +6

A robust 43-GHz VCO in CMOS for OC-768 SONET applications

A.P. van der Wel, S.L.J. Gierkink, R.C. Frye, +2

IEEE Journal of Solid-State Circuits

Robust 43-Ghz VcoOutput BuffersEngineeringVlsi DesignCircuit System +7

Relating random telegraph signal noise in metal-oxide-semiconductor transistors to interface trap energy distribution

A.P. van der Wel, Eric A.M. Klumperink, E. Hoekstra, +1

Applied Physics Letters

Electrical EngineeringTrap Energy DistributionEngineeringRf SemiconductorPhysics +11

Effect of switched biasing on 1/ <i>f</i> noiseand random telegraph signalsin deep-submicron MOSFETs

A.P. van der Wel, E.A.M. Klumperink, Bram Nauta

Electronics Letters

Modeling of RTS noise in MOSFETs under steady-state and large-signal excitation

J.S. Kolhatkar, E. Hoekstra, Cora Salm, +4

Device ModelingElectrical EngineeringEngineeringPhysicsElectronic Engineering +7

A Low-Power Microcontroller in a 40-nm CMOS Using Charge Recycling

Kristof Blutman, Ajay Kapoor, Arjun Majumdar, +7

IEEE Journal of Solid-State Circuits

Low-power Electronics40-Nm MicrocontrollerElectrical EngineeringActive Converter AreaEngineering +12