Microelectronic Engineering · 2004 · 15 citations · 7 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationDevice ModelingMetal-oxide-semiconductor Field-effect TransistorsSemiconductor Device MaterialsSemiconductor PhysicsShort-channel EffectsDeep DepletionFully Depleted Silicon-on-insulator ScalingFully Depleted Silicon-on-insulator TransistorsGate Oxide Thickness EffectsGate-induced Drain LeakageLeakage Current ReductionShort-channel Mobility DegradationSource-drain Leakage
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A comparative study of advanced MOSFET concepts
C. Wann, K. Noda, Tetsu Tanaka et al. · IEEE Transactions on Electron Devices · 1996 · 239 citations · Full text
Engineering, Electrical Engineering, Electronic Materials +16