Fabrication of Metal–Oxide–Diamond Field-Effect Transistors with Submicron-Sized Gate Length on Boron-Doped (111) H-Terminated Surfaces Using Electron Beam Evaporated SiO2 and Al2O3

Takeyasu Saito, Kyung-Ho Park, Kazuyuki Hirama, Hitoshi Umezawa, M Satoh, Hiroshi Kawarada, Zhi‐Quan Liu, Kazutaka Mitsuishi, Kazuo Furuya, Hideyo Okushi

Journal of Electronic Materials · 2011 · 33 citations · 29 references

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