High-Speed Cyclic Bend Tests and Board-Level Drop Tests for Evaluating the Robustness of Solder Joints in Printed Circuit Board Assemblies

E.H. Wong, S.K.W. Seah, Cheryl Selvanayagam, R. Rajoo, W.D. van Driel, J.F.J.M. Caers, Xiujuan Zhao, N. Owens, M. Leoni, L.C. Tan,

Journal of Electronic Materials · 2009 · 24 citations · 3 references

Concepts

References

3