Cesium near-surface concentration in low energy, negative mode dynamic SIMS

Errors in near-surface and interfacial profiling of boron and arsenic

W. Vandervorst, Tom Janssens, Bert Brijs et al. · Applied Surface Science · 2004 · 42 citations

Natural Sciences, Materials Engineering, Materials Science +6

Ion-induced alkali-silicon interfaces: Atomistic simulations of collisional effects

W. Eckstein, M. Hou, V.I. Shulga · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1996 · 41 citations

Natural Sciences, Materials Science, Physics +16

Comparison of the retention characteristics of low-energy xenon and caesium implanted in silicon

N. Menzel, K. Wittmaack · Nuclear Instruments and Methods in Physics Research · 1981 · 30 citations

Engineering, Materials Engineering, Materials Science +13

Useful yields of MCsx+ clusters: a cesium concentration-dependent study on the Cation Mass Spectrometer (CMS)

Tom Wirtz, H.‐N. Migeon, H. Scherrer · International Journal of Mass Spectrometry · 2003 · 29 citations

Natural Sciences, Chemistry, Analytical Chemistry +14

Study of ionization processes during TOF-SIMS analysis by co-sputtering cesium and xenon

J. Brison, Laurent Houssiau · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2007 · 25 citations

Natural Sciences, Chemical Engineering, Chemistry +12