Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices

Umberto Celano, Ludovic Goux, Attilio Belmonte, +8

Nano Letters

Observed FilamentSuch FilamentEngineeringMicroscopyBiomedical Engineering +17

High-k dielectrics for future generation memory devices (Invited Paper)

J. A. Kittl, Karl Opsomer, M. Popovici, +35

Microelectronic Engineering

Electrical EngineeringSemiconductor DeviceEngineeringNanoelectronicsApplied Physics +5

Organic and perovskite solar cells for space applications

Ilaria Cardinaletti, Tim Vangerven, Steven Nagels, +13

Solar Energy Materials and Solar Cells

Materials ScienceEngineeringPerovskite Solar CellHalide PerovskitesPerovskite Solar Cells +3

Effect of bath concentration and curing time on the structure of non-functional thin organosilane layers on aluminium

Alexis Franquet, Christophe Le Pen, Herman Terryn, +1

Electrochimica Acta

Materials EngineeringMaterials ScienceAluminium NitrideEngineeringSurface Science +8

XPS study of the atmospheric corrosion of copper alloys of archaeological interest

V. Hayez, Alexis Franquet, Annick Hubin, +1

Surface and Interface Analysis

EngineeringCopper SulfateAbstract Xps AnalysisChemistryMineral Processing +19

Crystalline Properties and Strain Relaxation Mechanism of CVD Grown GeSn

Federica Gencarelli, Benjamin Vincent, J. Demeulemeester, +11

ECS Journal of Solid State Science and Technology

Silane coating of metal substrates: Complementary use of electrochemical, optical and thermal analysis for the evaluation of film properties

Iris De Graeve, J. Vereecken, Alexis Franquet, +2

Progress in Organic Coatings

Materials ScienceEngineeringFilm PropertiesSilane CoatingSurface Science +5

Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry

Alexis Franquet, J. De Laet, T. Schram, +4

Thin Solid Films

Materials ScienceSurface CharacterizationEngineeringAluminium SurfacesSurface Analysis +6

Composition and thickness of non-functional organosilane films coated on aluminium studied by means of infra-red spectroscopic ellipsometry

Alexis Franquet, Herman Terryn, J. Vereecken

Thin Solid Films

Materials ScienceInfra-red Spectroscopic EllipsometrySurface CharacterizationAluminium NitrideEngineering +5

Metal‐Insulator Transition in ALD VO₂ Ultrathin Films and Nanoparticles: Morphological Control

Antony Premkumar Peter, Koen Martens, Geert Rampelberg, +12

Advanced Functional Materials

Aluminium NitrideMorphological ControlEngineeringNanosheetTwo-dimensional Materials +15