Microelectronics Reliability · 2012 · 38 citations · 8 references
Natural SciencesMaterials EngineeringMaterials ScienceInterface ScienceMetallic MaterialsStorage SystemsDevice ReliabilityHigh-temperature MaterialsMetallic BondingMetalsReliable Storage SystemsStorage ReliabilityBonding Interface CharacterizationInterface ReliabilityThermal Reliability
8
Max Hansen, K. Anderko, H. W. Salzberg · Journal of The Electrochemical Society · 1958 · 14.8K citations
Behavior of aluminum oxide, intermetallics and voids in Cu–Al wire bonds
Huining Xu, C. Liu, Vadim V. Silberschmidt et al. · Acta Materialia · 2011 · 246 citations
Natural Sciences, Materials Engineering, Materials Science +12