Concepedia

Interface Reliability

Interface Reliability is a metric that quantifies the stability and consistency of electrical, thermal, and mechanical performance at semiconductor or system interfaces under varying operational and environmental conditions over time.

96

Publications

2.9K

Citations

438

Authors

126

Institutions

Publications per year

2017–2026

11

Parents

Publications

96

Measurement of interface strength by a laser spallation technique

Vijay Gupta, A. S. Argon, David M. Parks et al. · Journal of the Mechanics and Physics of Solids · 1992 · 152 citations

, , +14

Ambient stability of chemically passivated germanium interfaces

D. Bodlaki, Hiromichi Yamamoto, David H. Waldeck et al. · Surface Science · 2003 · 124 citations

, , +14

Reliability of wire-bonding and solder joint for high temperature operation of power semiconductor device

Yuri Yamada, Y. Takaku, Yuji Yagi et al. · Microelectronics Reliability · 2007 · 111 citations

, , +16

Bond reliability under humid environment for coated copper wire and bare copper wire

Tomohiro Uno · Microelectronics Reliability · 2010 · 107 citations

, , +15

Functional Cycles and Surface Mounting Attachment Reliability

W. Engelmaier · Circuit World · 1985 · 104 citations

, , +12

1–5 of 96

Authors

438

  1. GK
    G. Khatibi

    University of Vienna, Austria

    2 publications · 83 citations

    2

    h-index

  2. BW
    Bernhard Wunderle

    Fraunhofer Institute for Reliability and Microintegration, Germany

    2 publications · 45 citations

    2

    h-index

  3. VG
    Vijay Gupta

    University of California, Los Angeles, United States

    2 publications · 168 citations

    2

    h-index

  4. WV
    W.D. van Driel

    Delft University of Technology, Netherlands

    2 publications · 45 citations

    2

    h-index

  5. TU
    Tomohiro Uno

    Nippon Steel (Japan), Japan

    2 publications · 118 citations

    2

    h-index

1–5 of 438

Institutions

126

  1. IMEC

    Leuven, Belgium

    3 h-index

    30 publications

    518 citations

  2. Intel (United States)

    Santa Clara, United States

    3 h-index

    52 publications

    1.2K citations

  3. IBM (United States)

    Armonk, United States

    3 h-index

    23 publications

    836 citations

  4. STMicroelectronics (France)

    Montrouge, France

    3 h-index

    5 publications

    246 citations

  5. University of California, Berkeley

    Berkeley, United States

    2 h-index

    3 publications

    94 citations

  6. IBM Research - Thomas J. Watson Research Center

    Yorktown Heights, United States

    2 h-index

    13 publications

    415 citations

  7. Taiwan Semiconductor Manufacturing Company (Taiwan)

    Hsinchu, Taiwan

    2 h-index

    6 publications

    223 citations

  8. Siemens (Germany)

    Munich, Germany

    2 h-index

    6 publications

    170 citations

1–8 of 126

Venues

  1. Microelectronics Reliability

    17 publications · 742 citations

    15

    h-index

  2. Microelectronic Engineering

    4 publications · 126 citations

    4

    h-index

  3. IEEE Transactions on Electron Devices

    3 publications · 83 citations

    3

    h-index

  4. 3

    h-index

  5. IEEE Transactions on Magnetics

    3 publications · 55 citations

    3

    h-index

1–5