Publication | Closed Access
Behavior of aluminum oxide, intermetallics and voids in Cu–Al wire bonds
238
Citations
21
References
2011
Year
Materials ScienceMaterials EngineeringCu–al Wire BondsElectromigration TechniqueEngineeringAluminum OxideApplied PhysicsMetallurgical InteractionInterconnect (Integrated Circuits)
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