High thermal stability and low hysteresis dispersion AlGaN/GaN MOS-HEMTs with zirconia film design

Hsien‐Chin Chiu, Feng-Tso Chien, Hao-Wei Chuang, Kuo-Jen Chang, Yau-Tang Gau

Microelectronics Reliability · 2012 · 22 citations · 15 references

Concepts

References

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