IEEE Transactions on Electron Devices · 2012 · 24 citations · 16 references
EngineeringElectrical EngineeringMicroelectronicsMicrowave EngineeringSemiconductor DevicesDevice CharacterizationDevice ModelingDevice SimulationSemiconductor PhysicsWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesBreakdown VoltageCharge DistributionCompact Device ModelingField-effect Transistor SimulationGallium Nitride (Gan) MaterialsLarge-signal BehaviorSlew RateSmall-signal Device Modeling
We introduce a physics-based compact model for AlGaN/GaN heterojunction field-effect transistors (HFETs) that is suitable for both RF microwave and switched-mode power supply (SMPS) applications, so that RF techniques can help determine HFET performance in SMPS applications. Such simulations can predict the on-resistance, slew rate, and breakdown voltage from the physical design of the transistor. Starting from an expression for the drain-source conduction current, charge distribution and displacement current are determined. The new model was implemented in Verilog-A and implemented in AWRDE, the design environment from Applied Wave Research. The HFET model was validated by comparison with Silvaco simulations and with data from an AlGaN/GaN HFET S-band amplifier. The new model accurately predicts device performance for dc, small-signal, and large-signal operations.
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High Al-content AlGaN/GaN MODFETs for ultrahigh performance
Yifeng Wu, B.P. Keller, P. Fini et al. · IEEE Electron Device Letters · 1998 · 280 citations