Ion microprobe system combined with scanning electron microscope for high precision aiming

Single event upset imaging with a nuclear muprobe

Barney L. Doyle, K.M. Horn, D.S. Walsh et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1992 · 33 citations · Full text

Engineering, Nuclear Engineering, Nuclear Safety Analysis +3

Ion microbeam probing of sense amplifiers to analyze single event upsets in a CMOS DRAM

L. Geppert, U. Bapst, David F. Heidel et al. · IEEE Journal of Solid-State Circuits · 1991 · 23 citations

Engineering, Electrical Engineering, Physics +14

Ion microprobe system at Waseda University for semiconductor analysis

Iwao Ohdomari, M. Sugimori, M. Koh et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1991 · 21 citations

Natural Sciences, Chemistry, Materials Science +6

Effects of radiation on microelectronics and techniques for hardening

P. V. Dressendorfer · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1989 · 14 citations

Engineering, Electrical Engineering, Materials Science +10

Investigation of soft upsets in integrated circuit memories and charge collection in semiconductor test structures by the use of an ion microbeam

A.R. Knudson, A.B. Campbell · Nuclear Instruments and Methods in Physics Research · 1983 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +17