Electron Probe Microanalysis
Electron Probe Microanalysis is a microanalytical technique that uses a focused electron beam to generate characteristic X-rays from a solid sample, enabling quantitative elemental analysis at micrometer-scale spatial resolution.
2.7K
Publications
111.7K
Citations
8.1K
Authors
1.8K
Institutions
Publications per year
2017–2026
363
Variants
Epma
2.7K
Further Characterisation of the 91500 Zircon Crystal
Michael Wiedenbeck, John M. Hanchar, William H. Peck et al. · Geostandards and Geoanalytical Research · 2004 · 1.5K citations · Full text
A structural model for metallic glasses
D.B. Miracle · Nature Materials · 2004 · 1.3K citations
Natural Sciences, Materials Engineering, Materials Science +16
Atomic and Electronic Structure of Graphene-Oxide
K. Andre Mkhoyan, Alexander W. Contryman, J. Silcox et al. · Nano Letters · 2009 · 1.2K citations
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1.8K

Centre National de la Recherche Scientifique
Paris, France
28 h-index
162 publications
7.8K citations

Chinese Academy of Sciences
Beijing, China
23 h-index
156 publications
5.6K citations
University of Antwerp
Antwerp, Belgium
22 h-index
135 publications
5K citations

Tohoku University
Sendai, Japan
22 h-index
167 publications
11.4K citations
American Ceramic Society
Westerville, United States
21 h-index
51 publications
2.7K citations
University of Cambridge
Cambridge, United Kingdom
21 h-index
56 publications
5.1K citations
The University of Tokyo
Tokyo, Japan
21 h-index
74 publications
2.8K citations

University of Manchester
Manchester, United Kingdom
21 h-index
87 publications
3.3K citations
1–8 of 1.8K
70 publications · 3.2K citations
37
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76 publications · 4.7K citations
36
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JES · 51 publications · 2.4K citations
32
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184 publications · 5K citations
32
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61 publications · 3.4K citations
30
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