Single event upset imaging with a nuclear muprobe

Alpha-, boron-, silicon- and iron-ion-induced current transients in low-capacitance silicon and GaAs diodes

N. Bordes, Jeffrey M. Bradley, C.J. Maggiore et al. · IEEE Transactions on Nuclear Science · 1988 · 62 citations · Full text

Engineering, Electrical Engineering, Physics +16

Multidimensional ion microbeam analysis

Barney L. Doyle · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1986 · 45 citations

Natural Sciences, Electrical Engineering, Analytical Chemistry +3

Submicron STIM tomography reconstruction techniques

Graham Bench, K. Nugent, M. Cholewa et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1991 · 26 citations

Engineering, Biomedical Engineering, Biomedical Imaging +10

Ion microbeam probing of sense amplifiers to analyze single event upsets in a CMOS DRAM

L. Geppert, U. Bapst, David F. Heidel et al. · IEEE Journal of Solid-State Circuits · 1991 · 23 citations

Engineering, Electrical Engineering, Physics +14

Study of basic mechanisms of single event upset using high-energy microbeams

I. Nashiyama, T. Nishijima, Haruki Sekiguchi et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1991 · 22 citations

Engineering, Electrical Engineering, Radiation Physics +4