Concepedia
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1991 · 22 citations · 2 references
EngineeringElectrical EngineeringRadiation PhysicsRadiation Damage In MaterialsRadiation Microbeam StudiesRadiation-hardened MicroprocessorsSingle Event Upset Modeling
2
Alpha-, boron-, silicon- and iron-ion-induced current transients in low-capacitance silicon and GaAs diodes
N. Bordes, Jeffrey M. Bradley, C.J. Maggiore et al. · IEEE Transactions on Nuclear Science · 1988 · 62 citations · Full text
Engineering, Electrical Engineering, Physics +16
Transient Measurements of Ultrafast Charge Collection in Semicouductor Diodes
R. Steven Wagner, Jeffrey M. Bradley, N. Bordes et al. · IEEE Transactions on Nuclear Science · 1987 · 40 citations
Engineering, Electrical Engineering, Microelectronics +14