D.S. Walsh

SEU-sensitive volumes in bulk and SOI SRAMs from first-principles calculations and experiments

P.E. Dodd, A.R. Shaneyfelt, K.M. Horn et al. · IEEE Transactions on Nuclear Science · 2001 · 186 citations

Engineering, Computer Engineering, Electrical Engineering +17

Recoil refinements: Implications for the 40Ar/39Ar dating technique

T. C. Onstott, Mark L. Miller, Rodney C. Ewing et al. · Geochimica et Cosmochimica Acta · 1995 · 143 citations

Natural Sciences, Earth Sciences, Geophysics +9

Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

R.L. Pease, Andrew L. Sternberg, Y. Boulghassoul et al. · IEEE Transactions on Nuclear Science · 2002 · 82 citations

Engineering, Electrical Engineering, Circuit Theory +11

Comparison of the thermal stability of the codeposited carbon/hydrogen layer to that of the saturated implant layer

R.A. Causey, W.R. Wampler, D.S. Walsh · Journal of Nuclear Materials · 1990 · 67 citations

Natural Sciences, Materials Engineering, Materials Science +8

Single-event upset and snapback in silicon-on-insulator devices and integrated circuits

P.E. Dodd, M.R. Shaneyfelt, D.S. Walsh et al. · IEEE Transactions on Nuclear Science · 2000 · 58 citations · Full text

Engineering, Electrical Engineering, Electronic Materials +16