Microelectronics Reliability · 2001 · 41 citations · 8 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectromechanical SystemsMicroelectronicsDevice ReliabilityDurabilityFailure Mode AnalysisReliabilityReliability ModelingSemiconductor ReliabilitySolder Joint Residual StressSolder Joint StrengthSoldered Joints
8
Growth kinetics of intermetallic compounds in chip scale package solder joint
P.L. Tu, Y.C. Chan, K.C. Hung et al. · Scripta Materialia · 2001 · 140 citations
Natural Sciences, Materials Engineering, Materials Science +13
Board level reliability of CSP
Hiroyuki Juso, Yasuhisa Yamaji, Takeshi Kimura et al. · 2002 · 43 citations
Engineering, Manufacturing Engineering, Materials Science +14