Concepedia

On the accuracy of current TCAD hot carrier injection models in nanoscale devices

Alban Zaka, Quentin Rafhay, Matteo Iellina, Pierpaolo Palestri, R. Clerc, D. Rideau, Davide Garetto, E. Dornel, J. Singer, G. Pananakakis,

Solid-State Electronics · 2010 · 20 citations · 20 references

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Concepts

References

20

The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materials

Carlo Jacoboni, L. Reggiani · Reviews of Modern Physics · 1983 · 2.3K citations

, , +17

Hot-electron-induced MOSFET degradation—Model, monitor, and improvement

Chenming Hu, Simon Tam, Fu-Chieh Hsu et al. · IEEE Transactions on Electron Devices · 1985 · 1.1K citations

, , +17

Monte carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects

Massimo V. Fischetti, Steven E. Laux · Physical review. B, Condensed matter · 1988 · 976 citations

, , +17

Problems related to p-n junctions in silicon

W. Shockley · Solid-State Electronics · 1961 · 917 citations

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Emission probability of hot electrons from silicon into silicon dioxide

T.H. Ning, C. M. Osburn, H.N. Yu · Journal of Applied Physics · 1977 · 292 citations

, , +16