Alban Zaka

From MFM Capacitors Toward Ferroelectric Transistors: Endurance and Disturb Characteristics of ${\rm HfO}_{2}$-Based FeFET Devices

Stefan Mueller, Johannes Müller, Raik Hoffmann et al. · IEEE Transactions on Electron Devices · 2013 · 142 citations

Engineering, Electrical Engineering, Materials Science +14

Microscopic scale characterization and modeling of transistor degradation under HC stress

Yoann Mamy Randriamihaja, V. Huard, X. Federspiel et al. · Microelectronics Reliability · 2012 · 48 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

Performance investigation and optimization of Si:HfO₂ FeFETs on a 28 nm bulk technology

Stefan Mueller, Ekaterina Yurchuk, Stefan Slesazeck et al. · 2013 · 27 citations

Engineering, Electrical Engineering, Materials Science +17

On the accuracy of current TCAD hot carrier injection models in nanoscale devices

Alban Zaka, Quentin Rafhay, Matteo Iellina et al. · Solid-State Electronics · 2010 · 20 citations · Full text

Engineering, Electrical Engineering, Microelectronics +11

Hot carrier degradation: From defect creation modeling to their impact on NMOS parameters

Yoann Mamy Randriamihaja, Alban Zaka, V. Huard et al. · 2012 · 17 citations · Full text

Engineering, Electrical Engineering, Physics +17