G. Pananakakis

Ionizing radiation induced leakage current on ultra-thin gate oxides

A. Scarpa, A. Paccagnella, F. Montera et al. · IEEE Transactions on Nuclear Science · 1997 · 156 citations

Electrical Engineering, Engineering, Physics +11

Experimental and theoretical investigation of nano-crystal and nitride-trap memory devices

B. De Salvo, G. Ghibaudo, G. Pananakakis et al. · IEEE Transactions on Electron Devices · 2001 · 144 citations

Memory Operation, Electrical Engineering, Non-volatile Memory +14

Temperature dependence of the Fowler–Nordheim current in metal-oxide-degenerate semiconductor structures

G. Pananakakis, G. Ghibaudo, R. Kies et al. · Journal of Applied Physics · 1995 · 124 citations

Semiconductors, Oxide Heterostructures, Electrical Engineering +13

A thorough investigation of progressive breakdown in ultra-thin oxides. Physical understanding and application for industrial reliability assessment

F. Monsieur, Emmanuel Vincent, D. Roy et al. · 2003 · 118 citations

Engineering, Industrial Reliability Assessment, Reliability Criterion +19

Semi-Analytical Modeling of Short-Channel Effects in Si and Ge Symmetrical Double-Gate MOSFETs

A. Tsormpatzoglou, C.A. Dimitriadis, R. Clerc et al. · IEEE Transactions on Electron Devices · 2007 · 99 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +11