R. Kies

Temperature dependence of the Fowler–Nordheim current in metal-oxide-degenerate semiconductor structures

G. Pananakakis, G. Ghibaudo, R. Kies et al. · Journal of Applied Physics · 1995 · 124 citations

Semiconductors, Oxide Heterostructures, Electrical Engineering +13

Low leakage and low variability Ultra-Thin Body and Buried Oxide (UT2B) SOI technology for 20nm low power CMOS and beyond

F. Andrieu, O. Weber, J. Mazurier et al. · 2010 · 103 citations

Engineering, Vlsi Design, Integrated Circuits +16

7-Levels-Stacked Nanosheet GAA Transistors for High Performance Computing

Sylvain Barraud, B. Prévitali, C. Vizioz et al. · 2020 · 95 citations

Semiconductor Technology, Electrical Engineering, Gaa Transistors +12

Lowering the Reset Current and Power Consumption of Phase-Change Memories with Carbon-Doped Ge2Sb2Te5

Q. Hubert, C. Jahan, A. Toffoli et al. · 2012 · 30 citations

Carbon-doped Ge2sb2te5, Engineering, Energy Efficiency +19

Novel integration process and performances analysis of Low STandby Power (LSTP) 3D multi-channel CMOSFET (MCFET) on SOI with metal / high-K gate stack

Émilie Bernard, T. Ernst, B. Guillaumot et al. · 2008 · 30 citations

Low-power Electronics, Novel Integration Process, Electrical Engineering +13