Microelectronic Engineering · 1991 · 14 citations · 9 references
Natural SciencesMaterials EngineeringMaterials ScienceDigital ImagingOpticsDefect CharacterizationDefect ModelingDefectsDefects In Electronic MaterialsManufacturing DefectsComputational LithographyOptical LithographyPhotoresistsReticle DesignSurface Defect Imaging
9
W.G. Oldham, S.N. Nandgaonkar, Andrew R. Neureuther et al. · IEEE Transactions on Electron Devices · 1979 · 216 citations
Engineering, Computer Engineering, Electrical Engineering +15