Surface Defect Imaging
Surface Defect Imaging is a surface microscopy technique that specifically enables the visualization and characterization of microscopic imperfections or anomalies on material surfaces by differentiating defect regions from non-defective areas through contrast enhancement, spatial resolution, and imaging modalities tailored to surface topography and composition.
298
Publications
14.1K
Citations
1.1K
Authors
377
Institutions
Publications per year
2017–2026
149
Parents
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377

Zhejiang University
Hangzhou, China
11 h-index
53 publications
2.5K citations

Huazhong University of Science and Technology
Wuhan, China
10 h-index
29 publications
901 citations
Yuan Ze University
Taoyuan District, Taiwan
7 h-index
17 publications
1K citations
Tianjin University
Tianjin, China
7 h-index
25 publications
1.3K citations

Chinese Academy of Sciences
Beijing, China
6 h-index
28 publications
761 citations

Chongqing University
Chongqing, China
6 h-index
24 publications
1.7K citations

Northeastern University
Shenyang, China
6 h-index
25 publications
980 citations
University College London
London, United Kingdom
5 h-index
12 publications
976 citations
1–8 of 377
9 publications · 264 citations
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9 publications · 473 citations
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8 publications · 477 citations
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9 publications · 223 citations
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7 publications · 112 citations
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