Surface Defect Imaging

Surface Defect Imaging is a surface microscopy technique that specifically enables the visualization and characterization of microscopic imperfections or anomalies on material surfaces by differentiating defect regions from non-defective areas through contrast enhancement, spatial resolution, and imaging modalities tailored to surface topography and composition.

298

Publications

14.1K

Citations

1.1K

Authors

377

Institutions

Publications per year

2017–2026

149

Authors

1.1K

  1. DT
    Du‐Ming Tsai

    Yuan Ze University, Taiwan

    6 publications · 366 citations

    6

    h-index

  2. XL
    Xinyu Li

    Huazhong University of Science and Technology, China

    4 publications · 134 citations

    4

    h-index

  3. YY
    Yongying Yang

    Zhejiang University, China

    4 publications · 146 citations

    4

    h-index

  4. LG
    Liang Gao

    Huazhong University of Science and Technology, China

    4 publications · 122 citations

    4

    h-index

  5. TH
    Takahiro Hayashi

    Kyoto University, Japan

    4 publications · 182 citations

    4

    h-index

1–5 of 1.1K

Venues

  1. NDT & E International

    9 publications · 264 citations

    9

    h-index

  2. Measurement

    9 publications · 473 citations

    9

    h-index

  3. Expert Systems with Applications

    8 publications · 477 citations

    8

    h-index

  4. Optics and Lasers in Engineering

    9 publications · 223 citations

    7

    h-index

  5. 7

    h-index

1–5