Solid-State Electronics · 2002 · 136 citations · 13 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesSurface PassivationWide Band Gap SemiconductorsGallium NitrideGallium Nitride (Gan) MaterialsNitride PassivationPassivationPassivation MechanismsPassivation TechniquesSurface Passivation Layers
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GaN: Processing, defects, and devices
S. J. Pearton, J.C. Zolper, R. J. Shul et al. · Journal of Applied Physics · 1999 · 1.8K citations
High breakdown GaN HEMT with overlapping gate structure
N.-Q. Zhang, S. Keller, Giacinta Parish et al. · IEEE Electron Device Letters · 2000 · 308 citations
GaN based transistors for high power applications
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