Nitride Passivation

Nitride Passivation is a surface passivation technique that involves the application of a nitride-based dielectric layer to semiconductor surfaces to reduce interface defect states and minimize surface recombination, thereby enhancing electronic device performance and stability.

835

Publications

32.1K

Citations

3.8K

Authors

845

Institutions

Publications per year

2017–2026

140

Authors

3.8K

  1. SJ
    S. J. Pearton

    University of Florida, United States

    12 publications · 354 citations

    11

    h-index

  2. FR
    F. Ren

    University of Florida, United States

    10 publications · 327 citations

    10

    h-index

  3. CR
    C. R. Abernathy

    University of Florida, United States

    9 publications · 304 citations

    9

    h-index

  4. MW
    Maojun Wang

    Peking University, China

    7 publications · 230 citations

    7

    h-index

  5. TP
    Tomás Palacios

    Massachusetts Institute of Technology, United States

    7 publications · 321 citations

    7

    h-index

1–5 of 3.8K

Venues

  1. Journal of Crystal Growth

    54 publications · 1.8K citations

    27

    h-index

  2. Applied Physics Letters

    45 publications · 1.6K citations

    27

    h-index

  3. Applied Surface Science

    53 publications · 1.8K citations

    26

    h-index

  4. Solid-State Electronics

    45 publications · 1.4K citations

    23

    h-index

  5. IEEE Electron Device Letters

    32 publications · 1.7K citations

    22

    h-index

1–5