Microelectronic Engineering · 2001 · 30 citations · 6 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsThin FilmsDielectricsSemiconductor Device MaterialsSemiconductor Thin FilmsThin Film Electrical PropertiesThin Film Surface MorphologyThin-film MaterialsElectrical PropertiesGate Dielectric EngineeringGate DielectricsGate Oxide Thickness EffectsSemiconductor Oxide Thin FilmsThin Oxide FilmsThin-film Oxides
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Electrical characteristics of epitaxial CeO2 on Si(111)
Lee Tye, N. A. El-Masry, Toyohiro Chikyow et al. · Applied Physics Letters · 1994 · 158 citations
Tadahiko Hirai, Yoshihide Fujisaki, Kazuhito Nagashima et al. · Japanese Journal of Applied Physics · 1997 · 70 citations