Seok-Woo Nam

High performance PRAM cell scalable to sub-20nm technology with below 4F2 cell size, extendable to DRAM applications

I.S. Kim, S.L. Cho, D.H. Im et al. · 2010 · 184 citations

Engineering, Emerging Memory Technology, Dram Applications +21

Dielectric characteristics of Al2O3–HfO2 nanolaminates on Si(100)

M.-H. Cho, Youngchae Roh, C. N. Whang et al. · Applied Physics Letters · 2002 · 132 citations

Materials Engineering, Materials Science, Material Analysis +13

Effect of seepage forces on tunnel face stability

In-Mo Lee, Seok-Woo Nam, Jae-Hun Ahn · Canadian Geotechnical Journal · 2003 · 123 citations

Engineering, Mechanical Engineering, Tunnel Face +19

PRAM cell technology and characterization in 20nm node size

Minjin Kang, Taegun Park, Yong-Jin Kwon et al. · 2011 · 94 citations

Materials Engineering, Materials Science, Electrical Engineering +12

The influence of seepage forces on ground reaction curve of circular opening

Seok Won Lee, Jong-Won Jung, Seok-Woo Nam et al. · Tunnelling and Underground Space Technology · 2006 · 78 citations

Engineering, Ground Reaction Curve, Circular Opening +4