Japanese Journal of Applied Physics · 2006 · 26 citations · 2 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationDevice ModelingIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsStrain EngineeringStress-strain BehaviorElectrical Properties AnalysisField-effect Transistor SimulationFully Depleted Silicon-on-insulator TransistorsSiliconSilicon-on-insulator TechnologySimulation AnalysisStrain EffectsStrain Effects On Electronic Properties
International audience
2