M. Broekaart

Coherent electron focusing with quantum point contacts in a two-dimensional electron gas

H. van Houten, C. W. J. Beenakker, J. Williamson et al. · Physical review. B, Condensed matter · 1989 · 340 citations · Full text

Categoryquantum Electronics, Engineering, Electron Diffraction +20

Observation of zero-dimensional states in a one-dimensional electron interferometer

B. J. van Wees, L. P. Kouwenhoven, C. J. P. M. Harmans et al. · Physical Review Letters · 1989 · 335 citations · Full text

Quantum Science, Engineering, Physics +13

Hot-electron spectrometry with quantum point contacts

J. Williamson, H. van Houten, C. W. J. Beenakker et al. · Physical review. B, Condensed matter · 1990 · 48 citations · Full text

Categoryquantum Electronics, Engineering, Point Contact +16

Characterization and integration of a CVD porous SiOCH (k<2.5) with enhanced mechanical properties for 65 nm CMOS interconnects and below

L.L. Chapelon, V. Arnal, M. Broekaart et al. · Microelectronic Engineering · 2004 · 36 citations

Materials Science, Electrical Engineering, Engineering +13

A functional 0.69 μm/sup 2/ embedded 6T-SRAM bit cell for 65 nm CMOS platform

F. Arnaud, F. Salvetti, D. Lenoble et al. · 2004 · 30 citations

Low Power, Electrical Engineering, Engineering +14