Concepedia

The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA)

W. Huott, M. McManus, D.R. Knebel, S.E. Steen, Dennis G. Manzer, P. N. Sanda, S. Wilson, Y.H. Chan, Antonio Pelella, S. Polonsky

2003 · 23 citations · 7 references

DOI

Concepts

EngineeringComputer EngineeringElectrical EngineeringEmbedded SystemsLow-power DesignSystem-on-chip DesignBuilt-in Self-testDesign For TestabilityDigital Signal ProcessingError DetectionHardware DebuggingTiming AnalysisDifferential Fault AnalysisIn-circuit DebuggingSilicon Debugging

Abstract

This paper will provide a case study of a particularly difficult debug problem (the Holey Shmoo problem) which developed while designing the IBM System/390 G6 637 MHz microprocessor chip. Resolution of this problem involved the use of some of today's newest DFD/DFT and diagnostics techniques. The discussion of the Holey Shmoo problem and its debug will serve to highlight and demonstrate some of these advanced techniques.

References

7

Shmoo plotting: the black art of IC testing

K. Baker, J. Van Beers · IEEE Design & Test of Computers · 1997 · 88 citations

Engineering, Manufacturing Engineering, Experimental Design +6

Dynamic internal testing of CMOS circuits using hot luminescence

J. A. Kash, J. C. Tsang · IEEE Electron Device Letters · 1997 · 78 citations

Engineering, Computer Engineering, Electrical Engineering +15

Picosecond imaging circuit analysis

J. C. Tsang, J. A. Kash, David P. Vallett · IBM Journal of Research and Development · 2000 · 71 citations

Engineering, Computer Engineering, Electrical Engineering +11

Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip

M.P. Kusko, Bryan Robbins, T.J. Snethen et al. · 2002 · 26 citations

Engineering, Computer Engineering, Computer Science +16

Testing the 400 MHz IBM generation-4 CMOS chip

T.G. Foote, D. E. Hoffman, W. Huott et al. · 2002 · 23 citations

Engineering, Computer Engineering, Electrical Engineering +13