M. McManus

Testing and Diagnostics of CMOS Circuits Using Light Emission from Off-State Leakage Current

Franco Stellari, Peilin Song, J. C. Tsang et al. · IEEE Transactions on Electron Devices · 2004 · 49 citations

Hardware Security, Electrical Engineering, Engineering +14

Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs

Kiran Chatty, P.E. Cottrell, Robert Gauthier et al. · 2004 · 36 citations

Cable Discharge Event, Electrical Engineering, Engineering +11

Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup

Alan J. Weger, Steven H. Voldman, Franco Stellari et al. · 2003 · 36 citations

Transmission Line Pulse, Electrical Engineering, Circuit Analysis +12

Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor

Peilin Song, Franco Motika, D.R. Knebel et al. · 2003 · 27 citations

Engineering, Root Cause, Diagnosis +16

Picosecond Imaging Circuit Analysis of Leakage Currents in CMOS Circuits

Stas Polonsky, Alan J. Weger, M. McManus · Proceedings - International Symposium for Testing and Failure Analysis · 2002 · 27 citations

Photonics, Electrical Engineering, Engineering +15