Franco Stellari - Concepedia

Author

Franco Stellari

IBM Research - Thomas J. Watson Research Center ORCID

Also Known As

F Stellari, F. STELLARI, F. Stellari, Franco Stellari, Stellari, Franco

102

Publications

1.1K

Citations

H-Index

Concepts

All Affiliations

IBM Research - Thomas J. Watson Research Center IBM (United States)Politecnico di Milano Essex Westford School District University of Vermont

About

Franco Stellari is an author at IBM Research - Thomas J. Watson Research Center specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	16	31	852
2	Applied Physics	12	13	405
3	Health Sciences	2	2	72
4	Education	1	1	20
5	Natural Sciences	1	1	12

Franco Stellari

Publications

852

Citations

H-Index

Page 1

	Year	Citations
New formulas of interconnect capacitances based on results of conformal mapping method Franco Stellari, Andrea L. Lacaita IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringEngineeringConformal Mapping MethodApplied Physics	2000	115
CMOS Circuit Testing via Time-Resolved Luminescence Measurements and Simulations Franco Stellari, Alberto Tosi, Franco Zappa, IEEE Transactions on Instrumentation and Measurement Continuous TrendPhotonicsElectrical EngineeringCmos Circuit TestingEngineering	2004	60
A novel scan chain diagnostics technique based on light emission from leakage current Peilin Song, Franco Stellari, Tian Xia, Hardware TrojanEngineeringVlsi DesignDiagnosisComputer Architecture	2005	57
Verification of untrusted chips using trusted layout and emission measurements Franco Stellari, Peilin Song, Alan J. Weger, Hardware TrojanEngineeringHardware Verification LanguageInformation SecurityVerification	2014	51
Testing and Diagnostics of CMOS Circuits Using Light Emission from Off-State Leakage Current Franco Stellari, Peilin Song, J. C. Tsang, IEEE Transactions on Electron Devices Hardware SecurityElectrical EngineeringEngineeringVlsi DesignCircuit System	2004	49
High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements Franco Stellari, Franco Zappa, S. Cova, IEEE Transactions on Electron Devices PhotonicsElectrical EngineeringEngineeringCircuit SystemPhysics	2001	40
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs Kiran Chatty, P.E. Cottrell, Robert Gauthier, Cable Discharge EventElectrical EngineeringEngineeringVlsi DesignCircuit System	2004	36
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup Alan J. Weger, Steven H. Voldman, Franco Stellari, Transmission Line PulseElectrical EngineeringCircuit AnalysisEngineeringComputer Engineering	2003	36
Tools for non-invasive optical characterization of CMOS circuits Franco Stellari, Franco Zappa, S. Cova, Ulsi CircuitsEngineeringOptical TestingCmos CircuitsOptical Characterization	2003	35
MARVEL &#x2014; Malicious alteration recognition and verification by emission of light Peilin Song, Franco Stellari, Dirk Pfeiffer, EngineeringInformation ForensicsImage ManipulationDetection TechniqueIntegrated Circuits	2011	34

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