CMOS Circuit Testing via Time-Resolved Luminescence Measurements and Simulations

Abstract

The continuous trend in modern CMOS technology toward smaller devices and faster clock frequency is challenging the picosecond imaging circuit analysis technique. In this paper we discuss the role of the single-photon avalanche diode with very sharp time resolution in testing CMOS circuits. Thanks to the 30 ps-time resolution, innovative measurements regarding delays and jitter are presented, along with a case study. A compact model of the luminescence is also proposed and used to compare on-chip electrical signals with optical waveforms.