David P. Vallett

Picosecond imaging circuit analysis

J. C. Tsang, J. A. Kash, David P. Vallett · IBM Journal of Research and Development · 2000 · 71 citations

Engineering, Vlsi Design, Microscopy +18

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment

P. Nigh, David P. Vallett, A. M. Patel et al. · 2003 · 53 citations

Fault Diagnosis, Engineering, Verification +16

IC failure analysis: the importance of test and diagnostics

David P. Vallett · IEEE Design & Test of Computers · 1997 · 46 citations

Customer Satisfaction, Fault Diagnosis, Engineering +17

Time-resolved optical characterization of electrical activity in integrated circuits

J. C. Tsang, J. A. Kash, David P. Vallett · Proceedings of the IEEE · 2000 · 27 citations

Optical Materials, Time-resolved Optical Characterization, Engineering +20

Diagnosis and characterization of timing-related defects by time-dependent light emission

D.R. Knebel, P. N. Sanda, M. McManus et al. · 2002 · 24 citations

Engineering, Integrated Circuits, Defect Tolerance +18