IC failure analysis: the importance of test and diagnostics

David P. Vallett

IEEE Design & Test of Computers · 1997 · 46 citations · 4 references

Concepts

Abstract

Continuous improvements in yield, reliability, time to market, and customer satisfaction all benefit from quick corrective action through root-cause failure analysis. The author reviews software- and hardware-based diagnostic methods for fault localization, the first and most critical step in this process.

References

4