Defect Localization is a functional verification technique that identifies the specific location of a design fault within a hardware or software system by analyzing observed erroneous behavior in relation to expected specifications.
505
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28.1K
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1.6K
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542
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Publications per year
2017–2026
188
Parents
Publications
505
Electron Localization Determines Defect Formation on Ceria Substrates
Friedrich Esch, Stefano Fabris, Ling Zhou et al. · Science · 2005 · 1.4K citations
A Survey on Software Fault Localization
W. Eric Wong, Ruizhi Gao, Yihao Li et al. · IEEE Transactions on Software Engineering · 2016 · 1.1K citations
1–5 of 505
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Institutions
542
Carnegie Mellon University
Pittsburgh, United States
12 h-index
37 publications
1.8K citations
Peking University
Beijing, China
12 h-index
46 publications
3K citations
Purdue University West Lafayette
West Lafayette, United States
12 h-index
19 publications
2.8K citations
Singapore Management University
Singapore, Singapore
10 h-index
21 publications
1.5K citations
Delft University of Technology
Delft, The Netherlands
10 h-index
27 publications
2.6K citations
The University of Texas at Dallas
Richardson, United States
10 h-index
24 publications
5.6K citations
IBM (United States)
Armonk, United States
9 h-index
14 publications
731 citations
University of Michigan
Ann Arbor, United States
9 h-index
21 publications
565 citations
1–8 of 542
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- IEEE Transactions on Software Engineering
TSE · 13 publications · 1.9K citations
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- Journal of Systems and Software
JSS · 13 publications · 513 citations
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- Proceedings - International Symposium for Testing and Failure Analysis
9 publications · 200 citations
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- IEEE Transactions on Instrumentation and Measurement
10 publications · 701 citations
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- IEEE Access
9 publications · 356 citations
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